ASTM- Workshop on Detection Limits without Noise
Sponsored by ASTM D22 Committee on Air Quality
On-line access to presentations given on April 2nd, 2020
This workshop provided an opportunity for those working with certain instruments, such as mass spectrometers, to discuss ways of calculating detection limits when the instruments do not have appreciable noise such as mass spectrometers and particle counters. Below you can find PDF versions of the presentations given during the online workshop:
Topics and Presenters:
- Where Did the Noise Go? An Introduction: Kurt Thaxton- GERSTEL
- Statistics of Noiseless Detectors: Thomas M. Semkow, Xin Li, Liang T. Chu- NY State Dept of Health
- LOD’s to the USFDA for Pharma-Related Work: Michael Louis- Jordi Labs
- Considering Detection Limit Calculations in Single and Multi-dimensional Gas Chromatography: Nicholas Snow- Seton Hall University
- Bringing Detection Limits Online for Real-Time Measurements by SIFT-MS: Caleb Allpress- Syft Technologies
- Detection Limits Without Noise: Why Instrument Detection Limit (IDL) is a Better Metric for Determining the Sensitivity: Shash Jain- Agilent Technologies